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二碲化鈮晶體 NbTe2(Niobium Selenide)
晶體尺寸：~8毫米
電學性能：金屬，半導體（TC ~ 0.7k）
晶體結構：單斜晶系，C
晶胞參數：a＝1.470 nm，b＝0.364，c＝0.935 nm，α＝γ＝90°，β＝108°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a NbTe2 single crystal aligned along the (101) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (h 0 l), with h = l = 1, 2, 3, 4
Powder X-ray diffraction (XRD) of a single crystal NbTe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal NbTe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal NbTe2. Measurement was performed with a 785 nm Raman system at room temperature.
聯系人：陳谷一
地址：江蘇省泰州市鳳凰西路168號
郵箱：taizhou@sunano.com.cn
電話：021-56830191
